Secondary State Assignment for Sequential Machines. - Zvi Kohavi (IEEE Trans. Electron. Comput., 1964)

Decomposition of sequential machines - Zvi Kohavi; Edward J. Smith (SWCT, 1965)

Reduction of Output Dependency in Sequential Machines. - Zvi Kohavi (IEEE Trans. Electron. Comput., 1965)

Synthesis of Multiple Sequential Machines - Edward J. Smith; Zvi Kohavi (SWAT, 1966)

Design of diagnosable sequential machines. - Zvi Kohavi; Pierre Lavallée (AFIPS Spring Joint Computing Conference, 1967)

Design of Sequential Machines with Fault-Detection Capabilities. - Zvi Kohavi; Pierre Lavallée (IEEE Trans. Electron. Comput., 1967)

Variable-Length Distinguishing Sequences and Their Application to the Design of Fault-Detection Experiments. - Igal Kohavi; Zvi Kohavi (IEEE Trans. Computers, 1968)

Designing Sets of Fault-Detection Tests ror Combinational Logic Circuits. - Zvi Kohavi; DeWayne A. Spires (IEEE Trans. Computers, 1971)

Detection of Multiple Faults in Combinational Logic Networks. - Igal Kohavi; Zvi Kohavi (IEEE Trans. Computers, 1972)

Machine Distinguishing Experiments. - Zvi Kohavi; J. A. Rivierre; Igal Kohavi (Comput. J., 1973)

Establishing Certain Bounds Concerning Finite Automata. - Zvi Kohavi; Joseph Winograd (J. Comput. Syst. Sci., 1973)

Fault Detection in Fanout-Free Combinational Networks. - Israel Berger; Zvi Kohavi (IEEE Trans. Computers, 1973)

Checking experiments for sequential machines. - Zvi Kohavi; J. A. Rivierre; Igal Kohavi (Inf. Sci., 1974)

Fault Diagnosis in Combinational Tree Networks. - Zvi Kohavi; Israel Berger (IEEE Trans. Computers, 1975)

Sequential Fault Diagnosis in Combinational Networks. - Israel Koren; Zvi Kohavi (IEEE Trans. Computers, 1977)

Diagnosis of Intermittent Faults in Combinational Networks. - Israel Koren; Zvi Kohavi (IEEE Trans. Computers, 1977)

On the Properties of Sensitized Paths. - Israel Koren; Zvi Kohavi (IEEE Trans. Computers, 1979)

The minimum test set problem for circuits with nonreconvergent fanout. - Irith Pomeranz; Zvi Kohavi (J. Electron. Test., 1991)

Polynomial Complexity Algorithms for Increasing the Testability of Digital Circuits by Testing Module Insertion. - Irith Pomeranz; Zvi Kohavi (IEEE Trans. Computers, 1991)

A limited exponential complexity algorithm for increasing the testability of digital circuits by testing-module insertion. - Irith Pomeranz; Zvi Kohavi (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

An optimal algorithm for cycle breaking in directed graphs. - Tatiana Orenstein; Zvi Kohavi; Irith Pomeranz (J. Electron. Test., 1995)