Anis Hoayek

According to our database, Anis Hoayek authored at least 11 papers between 2021 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry.

Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet, Jérôme Adrian

J. Intell. Manuf., April, 2025

Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.

Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher

J. Intell. Manuf., January, 2025

Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry.

Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher

J. Intell. Manuf., January, 2025

Assessing clustering methods using Shannon's entropy.

Anis Hoayek, Didier Rullière

Inf. Sci., 2025

Coupling Variable Selection and Anomaly Detection: Record-Based Approach.

Michel Kamel, Anis Hoayek, Mireille Batton-Hubert

Proceedings of the 5th IEEE Middle East and North Africa Communications Conference, 2025

2024

Unsupervised approach for an optimal representation of the latent space of a failure analysis dataset.

Abbas Rammal, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert

J. Supercomput., March, 2024

Anomaly Detection in a Production Line: Statistical Learning Approach and Industrial Application.

Rida Kheirallah, Anis Hoayek, Frédéric Grimaud, Mireille Batton-Hubert, Patrick Burlat

Proceedings of the Advances in Production Management Systems. Production Management Systems for Volatile, Uncertain, Complex, and Ambiguous Environments, 2024

2022

Leveraging Pre-trained Models for Failure Analysis Triplets Generation.

Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet, Jérôme Adrian

CoRR, 2022

GCVAE: Generalized-Controllable Variational AutoEncoder.

Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher

CoRR, 2022

NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry.

Zhiqiang Wang, Kenneth Ezukwoke, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher

Proceedings of the 27th IEEE International Conference on Emerging Technologies and Factory Automation, 2022

2021

Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering.

Kenneth Ezukwoke, Houari Toubakh, Anis Hoayek, Mireille Batton-Hubert, Xavier Boucher, Pascal Gounet

Proceedings of the 17th IEEE International Conference on Automation Science and Engineering, 2021