D. Oh

According to our database, D. Oh authored at least 2 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Multiscale Modeling and Calibration of Hot-Carrier Stress Degradation in SiGe DRAM Peripheral MOSFETs.

L. Silvestri, S. Jin, W. Jeong, H. Shim, W. Yim, H. Kwon, D. Oh, S. Son, N. Zographos, N. Kim, X.-W. Lin, L. Sponton, Y. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2019

Concurrent validity and intra-trial reliability of a bluetooth-embedded inertial measurement unit for real-time joint range of motion.

D. Oh, W. Lim, N. Lee

Int. J. Comput. Sci. Sport, 2019