Ernest Wu

According to our database¹, Ernest Wu authored at least 2 papers between 2023 and 2025.

Collaborative distances:

Awards

IEEE Fellow 2016, "For contributions to gate oxide reliability of CMOS devices".

Book

In proceedings

Article

PhD thesis

Dataset

Other

2025

New Loss Function for Learning Dielectric Thickness Distributions and Generative Modeling of Breakdown Lifetime.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2023

Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Reliability Physics Symposium, 2023