Gyoungyeop do
Orcid: 0009-0008-6997-3130
According to our database1,
Gyoungyeop do
authored at least 2 papers
in 2024.
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Bibliography
2024
Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors.
IEEE Access, 2024
Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors.
IEEE Access, 2024