Gyoungyeop do
Orcid: 0009-0008-6997-3130
  According to our database1,
  Gyoungyeop do
  authored at least 2 papers
  in 2024.
  
  
Collaborative distances:
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Bibliography
  2024
Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors.
    
  
    IEEE Access, 2024
    
  
Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors.
    
  
    IEEE Access, 2024