Hao Niu

Orcid: 0000-0003-0695-8052

Affiliations:
  • Harbin Institute of Technology, School of Electrical Engineering and Automation, Harbin, China


According to our database1, Hao Niu authored at least 3 papers between 2017 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

Online presence:

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Bibliography

2018
Manufacturing process-based storage degradation modelling and reliability assessment.
Microelectron. Reliab., 2018

Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts.
Microelectron. Reliab., 2018

2017
Converter-level FEM simulation for lifetime prediction of an LED driver with improved thermal modelling.
Microelectron. Reliab., 2017


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