Hiu Yung Wong
Orcid: 0000-0003-0135-7469
According to our database1,
Hiu Yung Wong
authored at least 15 papers
between 2018 and 2025.
Collaborative distances:
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Bibliography
2025
Application of Machine Learning for Correcting Defect-induced Neuromorphic Circuit Inference Errors.
CoRR, September, 2025
Prediction of Alpha-Particle-Immune Gate-All-Around Field-Effect Transistors (GAA-FET) Based SRAM Design.
CoRR, July, 2025
Ga<sub>2</sub>O<sub>3</sub> TCAD Mobility Parameter Calibration using Simulation Augmented Machine Learning with Physics Informed Neural Network.
CoRR, April, 2025
2024
Physics-Informed Neural Network for Predicting Out-of-Training-Range TCAD Solution with Minimized Domain Expertise.
CoRR, 2024
Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning.
CoRR, 2024
A Heuristic Error Analysis Framework for Error Bottleneck Identification in Gate-Based Quantum Algorithms.
Proceedings of the IEEE International Conference on Quantum Computing and Engineering, 2024
Proceedings of the IEEE International Conference on Quantum Computing and Engineering, 2024
2023
Device Image-IV Mapping using Variational Autoencoder for Inverse Design and Forward Prediction.
CoRR, 2023
A Step-by-Step HHL Algorithm Walkthrough to Enhance Understanding of Critical Quantum Computing Concepts.
IEEE Access, 2023
2022
Vertical GaN Diode BV Maximization through Rapid TCAD Simulation and ML-enabled Surrogate Model.
CoRR, 2022
A Software-Circuit-Device Co-Optimization Framework for Neuromorphic Inference Circuits.
IEEE Access, 2022
Quantum Computing and Information Specialization in Electrical Engineering Master Degree.
Proceedings of the IEEE International Conference on Quantum Computing and Engineering, 2022
Effect of ReRAM Neuromorphic Circuit Array Variation and Fault on Inference Accuracy.
Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022
2020
Improvement of TCAD Augmented Machine Learning Using Autoencoder for Semiconductor Variation Identification and Inverse Design.
IEEE Access, 2020
2018