Huijun Kim
Orcid: 0009-0000-7127-8788Timeline
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Bibliography
2025
Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3-nm Technology Node.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2025
Investigation on Artificial Intelligence Hardware Architecture Design Based on Logic-in-Memory Ferroelectric Fin Field-Effect Transistor at Sub-3nm Technology Nodes.
Adv. Intell. Syst., February, 2025