Kun Tan
Orcid: 0000-0002-1591-2876Affiliations:
- University of Leicester, Leicester, UK
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Bibliography
2023
In Situ Diagnosis of Multichip IGBT Module Wire Bonding Faults Based on Collector Voltage Undershoot.
IEEE Trans. Ind. Electron., 2023
A Carrier-Based DPWM Method With Variable Clamped Interval for NPC Three-Level Inverter.
Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023