Lishuo Deng

According to our database1, Lishuo Deng authored at least 10 papers between 2023 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2025
A 40nm Early-Warning AVFS Design with Path Activation-Based Monitoring Point Optimization.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2025

A 250M-2.5GHz Two-Stage Duty-Cycle Corrector with 10%-90% Correction Range and 3-Cycle Correction Latency for Mitigating Aging Effects.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2025

Variation-Adaptive Negative Bitline and Skip Bitline Pre-charge Scheme for Low-Power SRAM.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2025

Efficient Hold Buffer Optimization by Supply Noise-Aware Dynamic Timing Analysis.
Proceedings of the Design, Automation & Test in Europe Conference, 2025

2024
FLC-EDC: A Fast Low-Cost Error Detection and Correction Scheme for AVFS System Based on Flip-Flops Resampling in 28-nm CMOS.
IEEE Trans. Circuits Syst. II Express Briefs, January, 2024

A 22nm Variation-Tolerant Clock Duty-Cycle Controller for Mitigating Aging-Induced Clock Duty-Cycle Distortion with Path Replica.
Proceedings of the IEEE International Conference on Integrated Circuits, 2024

An Adaptive Wide-Voltage-Range Droop Detection and Protection System Assisted with Timing Error Detection in 28nm CMOS.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2024

An All-digital, 3.68 mV/LSB Voltage Sensor based Droop Prediction and Fast Mitigation System in 28nm CMOS.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2024

2023
IVATS: A Leakage Reduction Technique Based on Input Vector Analysis and Transistor Stacking in CMOS Circuits.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

TEPD: A Compound Timing Detection of Both Data-Transition and Path-Activation for Reliable In-Situ Timing Error Detection and Correction in 28nm CMOS.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2023


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