Romano Giannetti
Orcid: 0000-0003-4671-6242
  According to our database1,
  Romano Giannetti
  authored at least 19 papers
  between 1998 and 2024.
  
  
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
  2024
Measuring Sedimentation Profiles for Nanoparticle Characterization through a Square Spiral Resonator Sensor.
    
  
    Sensors, May, 2024
    
  
  2023
Low-Cost Electronics for Automatic Classification and Permittivity Estimation of Glycerin Solutions Using a Dielectric Resonator Sensor and Machine Learning Techniques.
    
  
    Sensors, 2023
    
  
  2021
Resonator-Based Microwave Metamaterial Sensors for Instrumentation: Survey, Classification, and Performance Comparison.
    
  
    IEEE Trans. Instrum. Meas., 2021
    
  
    Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021
    
  
  2017
    IEEE Trans. Instrum. Meas., 2017
    
  
    Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2017
    
  
  2015
    Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015
    
  
  2009
Characterization of the Accommodation Effect in Soft Hysteretic Materials Via Sensorless Measurement Technique.
    
  
    IEEE Trans. Instrum. Meas., 2009
    
  
    IEEE Trans. Instrum. Meas., 2009
    
  
  2008
Sensorless Measurement Technique for Characterization of Magnetic Material Under Nonperiodic Conditions.
    
  
    IEEE Trans. Instrum. Meas., 2008
    
  
  2006
New method to characterize magnetic hysteresis in soft ferrites up to high frequencies.
    
  
    IEEE Trans. Instrum. Meas., 2006
    
  
  2005
    IEEE Trans. Instrum. Meas., 2005
    
  
    IEEE Trans. Instrum. Meas., 2005
    
  
  2002
    IEEE Trans. Instrum. Meas., 2002
    
  
  2001
    IEEE Trans. Instrum. Meas., 2001
    
  
  2000
    IEEE Trans. Instrum. Meas., 2000
    
  
  1998
    IEEE Trans. Instrum. Meas., 1998
    
  
True constant temperature measurement system for lifetime tests of metallic interconnections of IC's.
    
  
    IEEE Trans. Instrum. Meas., 1998