Rui Yang
Orcid: 0000-0003-3738-1612
According to our database1,
Rui Yang
authored at least 2 papers
between 2024 and 2025.
Collaborative distances:
Collaborative distances:
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Bibliography
2025
Optimization and Validation of Wafer Surface Defect Detection Algorithm Based on RT-DETR.
IEEE Access, 2025
2024
Proceedings of the 2024 3rd International Conference on Frontiers of Artificial Intelligence and Machine Learning, 2024