S. Jin

According to our database, S. Jin authored at least 2 papers between 2006 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Multiscale Modeling and Calibration of Hot-Carrier Stress Degradation in SiGe DRAM Peripheral MOSFETs.

L. Silvestri, S. Jin, W. Jeong, H. Shim, W. Yim, H. Kwon, D. Oh, S. Son, N. Zographos, N. Kim, X.-W. Lin, L. Sponton, Y. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2006

Reducing Packet Loss in CBC Secured VoIP using Interleaved Encryption.

Richard M. Dansereau, S. Jin, Rafik A. Goubran

Proceedings of the Canadian Conference on Electrical and Computer Engineering, 2006