S. Race
According to our database1,
S. Race
authored at least 2 papers
between 2024 and 2025.
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Bibliography
2025
On How to Implement Experimentally Obtained Defect Characteristics in SiC Device Simulation.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2024
Exploring the border traps near the SiO2-SiC interface using conductance measurements.
Proceedings of the IEEE International Reliability Physics Symposium, 2024