Sam Van der Jeught

According to our database, Sam Van der Jeught authored at least 3 papers between 2015 and 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2025

Pattern Matters: The Impact of Projection Patterns on Deep Learning 3-D Profilometry.

Rhys G. Evans, Stef Bordo, Joris J. J. Dirckx, Sam Van der Jeught

IEEE Trans. Instrum. Meas., 2025

2024

Deep Learning for Single-Shot Structured Light Profilometry: A Comprehensive Dataset and Performance Analysis.

Rhys G. Evans, Ester Devlieghere, Robrecht Keijzer, Joris J. J. Dirckx, Sam Van der Jeught

J. Imaging, August, 2024

2015

Fast Fourier-Based Phase Unwrapping on the Graphics Processing Unit in Real-Time Imaging Applications.

Sam Van der Jeught, Jan Sijbers, Joris J. J. Dirckx

J. Imaging, 2015