Sanghyuk Moon

According to our database, Sanghyuk Moon authored at least 1 paper in 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Long-tailed detection and classification of wafer defects from scanning electron microscope images robust to diverse image backgrounds and defect scales.

Taekyeong Park, Yongho Son, Sanghyuk Moon, Seungju Han, Je Hyeong Hong

Eng. Appl. Artif. Intell., 2025