Tomoyuki Shoji

According to our database, Tomoyuki Shoji authored at least 2 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited).

Tetsuo Narita, Daigo Kikuta, Kenji Ito, Tomoyuki Shoji, Tomohiko Mori, Satoshi Yamaguchi, Yasuji Kimoto, Kazuyoshi Tomita, Masakazu Kanechika, Takeshi Kondo, Tsutomu Uesugi, Jun Kojima, Jun Suda, Yoshitaka Nagasato, Satoshi Ikeda, Hiroki Watanabe, Masayoshi Kosaki, Tohru Oka

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2015

Analysis of neutron-induced single-event burnout in SiC power MOSFETs.

Tomoyuki Shoji, Shuichi Nishida, Kimimori Hamada, Hiroshi Tadano

Microelectron. Reliab., 2015