Xianzhou Shao
Orcid: 0000-0003-3033-0396
According to our database1,
Xianzhou Shao
authored at least 2 papers
between 2023 and 2025.
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Bibliography
2025
Improved Memory Window and Retention of Silicon Channel Hf0.5Zr0.5O2 FeFET by Using SiO2/HfO2/SiO2 Gate Side Interlayer.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2023
Comprehensive Study of Endurance Fatigue in the Scaled Si FeFET by in-situ Vth Measurement and Endurance Enhancement Strategy.
Proceedings of the IEEE International Memory Workshop, 2023