Yongho Son
According to our database1,
Yongho Son
authored at least 3 papers
between 2023 and 2025.
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Bibliography
2025
Long-tailed detection and classification of wafer defects from scanning electron microscope images robust to diverse image backgrounds and defect scales.
Eng. Appl. Artif. Intell., 2025
Proceedings of the IEEE/CVF Winter Conference on Applications of Computer Vision, 2025
2023
Proceedings of the 14th International Conference on Information and Communication Technology Convergence, 2023