Yongning He
Orcid: 0000-0002-2419-2858
According to our database1,
Yongning He
authored at least 7 papers
between 2019 and 2025.
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Bibliography
2025
Minority Carrier Lifetime Test With a 3-D Printed Dielectric-Filled Waveguide Probe and Microwave Photoconductivity Decay Technique.
IEEE Trans. Instrum. Meas., 2025
Interrupted field-stop layer reverse conducting MOS controlled thyristor and mitigation of the voltage snapback.
Microelectron. J., 2025
2022
Lift-Off and Tilt Effect in Microwave Surface Resistance Measurement Using TE<sub>011</sub> Mode Cylindrical Cavity.
IEEE Trans. Instrum. Meas., 2022
2021
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2020
IEEE Trans. Instrum. Meas., 2020
2019
Compact Intermodulation Modulator for Phase Reference in Passive Intermodulation Measurements.
IEEE Trans. Instrum. Meas., 2019
Proceedings of the 11th International Conference on Wireless Communications and Signal Processing, 2019