Youngmin Oh

Orcid: 0000-0002-9279-0155

Affiliations:
  • Samsung Advanced Institute of Technology, Suwon, Gyeonggi-do, Korea


According to our database1, Youngmin Oh authored at least 2 papers between 2016 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
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Links

Online presence:

On csauthors.net:

Bibliography

2024
TraceFormer: S-parameter Prediction Framework for PCB Traces based on Graph Transformer.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024

2016
Stability, Instability, and Bifurcation in Electrified Thin Films.
SIAM J. Math. Anal., 2016


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