Yu Sun

According to our database, Yu Sun authored at least 1 paper in 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2025

Statistical-Analysis-Based Imaging-Free Method for Efficient and Fast Wafer Defect Detection.

Xiang Zhong, Yu Sun, Guangcheng Zhou, Yujia Liu, Yikai Zhu, Huaxia Deng, Mengchao Ma, Dong Chen, Xinglong Gong

IEEE Trans. Instrum. Meas., 2025