Zijin Lv

According to our database1, Zijin Lv authored at least 1 paper in 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2025
A High-Precision Wafer Defect Inspection System Integrating DMD-Based Parallel Confocal Imaging, Bright-Field Inspection, and MutexMatch Semi-Supervised Learning<sup>1</sup>.
Proceedings of the IEEE International Conference on Real-time Computing and Robotics, 2025


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