Alessandro Cultrera

Orcid: 0000-0001-8965-9116

According to our database1, Alessandro Cultrera authored at least 9 papers between 2015 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2025
Magnitude and Phase Calibration of Lock-In Amplifiers, and Analysis of the Noise Response.
IEEE Trans. Instrum. Meas., 2025

Calibration of mutual inductance standards with a fully-digital impedance bridge.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025

Electrical Resistance Tomography for the investigation of memristive nanowire networks.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2025

2024
Laboratory Replication of Low Power Quality Conditions Observed on the Field for Testing Active Energy Meters.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2024

2022
Metrological Characterization of Consumer-Grade Equipment for Wearable Brain-Computer Interfaces and Extended Reality.
IEEE Trans. Instrum. Meas., 2022

2021
Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications.
Proceedings of the IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2021

2016
Electrical Resistance Tomography of Conductive Thin Films.
IEEE Trans. Instrum. Meas., 2016

A simple algorithm to find the L-curve corner in the regularization of inverse problems.
CoRR, 2016

2015
Electrical Resistance Tomography on thin films: Sharp conductive profiles.
Proceedings of the 1st IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, 2015


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