Alexander Kotov
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Known people with the same name:
Bibliography
2023
Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays.
Proceedings of the IEEE International Memory Workshop, 2023
2021
Proceedings of Sixth International Congress on Information and Communication Technology, 2021
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020