Alina Caddemi
Orcid: 0000-0003-1513-440X
According to our database1,
Alina Caddemi
authored at least 19 papers
between 1996 and 2021.
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Bibliography
2021
Radar-Based Monitoring of the Worker Activities by Exploiting Range-Doppler and Micro-Doppler Signatures.
Proceedings of the IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2021
2020
Proceedings of the 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT, 2020
2019
Feasibility Study to Preserve the Health of an Industry 4.0 Worker: a Radar System for Monitoring the Sitting-Time.
Proceedings of the 2nd Workshop on Metrology for Industry 4.0 and IoT MetroInd4.0&IoT 2019, 2019
2018
Light activation of noise at microwave frequencies: a study on scaled gallium arsenide HEMT's.
IET Circuits Devices Syst., 2018
2017
Proceedings of the Applications in Electronics Pervading Industry, Environment and Society, 2017
2016
Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction.
Microelectron. Reliab., 2016
A feasibility study of a compact radar system for autonomous walking of blind people.
Proceedings of the 2nd IEEE International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow, 2016
2013
Analysis and validation of neural network approach for extraction of small-signal model parameters of microwave transistors.
Microelectron. Reliab., 2013
2010
Microelectron. J., 2010
Theoretical and experimental determination of onset and scaling of non-quasi-static phenomena for interdigitated fin field effect transistors.
IET Circuits Devices Syst., 2010
2006
Microwave characterization and modeling of packaged HEMTs by a direct extraction procedure down to 30 K.
IEEE Trans. Instrum. Meas., 2006
Microelectron. Reliab., 2006
2005
Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT's.
Microelectron. J., 2005
2004
A robust and fast procedure for the determination of the small signal equivalent circuit of HEMTs.
Microelectron. J., 2004
2003
Characterization techniques for temperature-dependent experimental analysis of microwave transistors.
IEEE Trans. Instrum. Meas., 2003
2002
Temperature-dependent noise characterization and modeling of on-wafer microwave transistors.
Microelectron. Reliab., 2002
2001
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001
1998
Determination of HEMT's noise parameters versus temperature using two measurement methods.
IEEE Trans. Instrum. Meas., 1998
1996
A study on the noise parameters of active devices based on a circuit model approach [HEMTs].
Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996