Arjan van de Ven

According to our database, Arjan van de Ven authored at least 2 papers between 2006 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

Optimization of Tests for Managing Silicon Defects in Data Centers.

David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven

Proceedings of the IEEE International Test Conference, 2022

2006

Chunkfs: Using Divide-and-Conquer to Improve File System Reliability and Repair.

Val Henson, Arjan van de Ven, Amit Gud, Zach Brown

Proceedings of the Second Workshop on Hot Topics in System Dependability, 2006