C. K. Lau

According to our database, C. K. Lau authored at least 2 papers between 2000 and 2013.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2013

A non-destructive technique using 3D X-ray Computed Tomography to reveal semiconductor internal physical defects.

C. H. Tan, C. K. Lau

Proceedings of the 2013 IEEE International Conference on Signal and Image Processing Applications, 2013

2000

Combining Advanced Process Technology and Design for Systems Level Integration.

Ana Hunter, C. K. Lau, John Martin

Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000