Cen Chen

According to our database, Cen Chen authored at least 13 papers between 2018 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

Cumulative Degradation Modeling of Electrolytic Capacitors Considering Stress Interactions in Industrial Applications.

Qisen Sun, Cen Chen, Zicheng Wang, Xuerong Ye, Min Xie, Guofu Zhai

IEEE Trans. Ind. Electron., September, 2025

2023

Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range.

Cen Chen, Chengzhi Sun, Liqin Wu, Xuerong Ye, Guofu Zhai

Qual. Reliab. Eng. Int., December, 2023

Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate.

Bokai Zheng, Cen Chen, Yigang Lin, Xuerong Ye, Guofu Zhai

IEEE Trans. Reliab., March, 2023

2022

Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process.

Bokai Zheng, Cen Chen, Yigang Lin, Yifan Hu, Xuerong Ye, Guofu Zhai, Enrico Zio

Reliab. Eng. Syst. Saf., 2022

A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling.

Xuerong Ye, Yifan Hu, Bokai Zheng, Cen Chen, Guofu Zhai

Reliab. Eng. Syst. Saf., 2022

2021

An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis.

Xuerong Ye, Yifan Hu, Junxian Shen, Cen Chen, Guofu Zhai

IEEE Trans. Instrum. Meas., 2021

Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator.

Xuerong Ye, Hao Chen, Cen Chen, Guofu Zhai

IEEE Trans. Ind. Electron., 2021

Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary.

Cen Chen, Yun Yang, Xuerong Ye, Guofu Zhai

IEEE Access, 2021

An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation.

Yun Yang, Cen Chen, Xuerong Ye, Chengzhi Sun

Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2021

2018

The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.

Xuerong Ye, Kaixin Zhang, Cen Chen, Zhongwei Li, Yue Wang, Guofu Zhai

Microelectron. Reliab., 2018

Fault localization of a switched mode power supply based on extended integer-coded dictionary method.

Xuerong Ye, Cen Chen, Guofu Zhai

Microelectron. Reliab., 2018

VDMOSFET HEF degradation modelling considering turn-around phenomenon.

Xuerong Ye, Cen Chen, Yixing Wang, L. Wang, Guofu Zhai

Microelectron. Reliab., 2018

A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.

Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht

IEEE Access, 2018