Dae Sin Kim

According to our database, Dae Sin Kim authored at least 9 papers between 2022 and 2026.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2026

An efficient multiscale coupling method for simulations of reactor-scale chemical vapor deposition with microstructural features.

Taegeun Kim, Hyoungsoo Ko, Jaewon Jang, Sejin Kim, Sunyoung Park, Jae Myung Choe, Young-gu Kim, Dae Sin Kim, Sangseung Lee, Donghyun You

Adv. Eng. Softw., 2026

2025

Solving the dopant diffusion dynamics with physics-informed neural networks.

Sungyeop Lee, Jisu Ryu, Young-Gu Kim, Dae Sin Kim, Hiroo Koshimoto, Jaeshin Park

J. Comput. Sci., 2025

Deriving optimal atomic layer deposition process conditions using machine learning.

Jangwon Seo, Hyo-Seok Hwang, Sunyoung Park, Seungmin Lee, Dae Sin Kim, Sun-Taek Lim, Junhee Seok

J. Ind. Inf. Integr., 2025

Large scale stress-aware epitaxial growth simulations using a hybrid Molecular Dynamics-Monte Carlo method.

Anthony Payet, Sangjun Yun, Jeonghwan Han, Alexander Schmidt, Inkook Jang, Dae Sin Kim

Comput. Phys. Commun., 2025

2024

Hardware efficient decomposition of the Laplace operator and its application to the Helmholtz and the Poisson equation on quantum computer.

Jaehyun Bae, Gwangsu Yoo, Satoshi Nakamura, Shota Ohnishi, Dae Sin Kim

Quantum Inf. Process., July, 2024

2023

On the atomistic origin of the polymorphism and the dielectric physical properties of beryllium oxide.

Linda S. Reitz, Peter C. Müller, David Schnieders, Richard Dronskowski, Woon Ih Choi, Won-Joon Son, Inkook Jang, Dae Sin Kim

J. Comput. Chem., 2023

Structural Reliability and Performance Analysis of Backside PDN.

Sunghwan Kim, Geun-Myeong Kim, Seong-Nam Kim, Saetbyeol Ahn, Yoon-Suk Kim, Inkook Jang, Kyoung-Woo Lee, Dae Sin Kim

Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023

2022

Generative Evolutionary Strategy For Black-Box Optimizations.

Changhwi Park, Seong Ryeol Kim, Young-Gu Kim, Dae Sin Kim

CoRR, 2022

Analysis and Optimization of an Analog MOSFET with a Slit Well at Channel Center Towards Higher Output Resistance.

Hiroki Fujii, Jaehyun Yoo, Dawon Jeong, Seongsik Min, Myoungsoo Kim, Uihui Kwon, Dae Sin Kim

Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022