SungHwan Kim

According to our database1, SungHwan Kim authored at least 1 paper in 2021.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2021
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress.
Proceedings of the IEEE International Reliability Physics Symposium, 2021


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