Daniel N. Zhang

According to our database, Daniel N. Zhang authored at least 1 paper in 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2006

The Use of the Manufacturing Sensitivity Model Forms to Comprehend Layout Manufacturing Robustness For Use During Device Design.

Lawrence S. Melvin III, Daniel N. Zhang, Kirk J. Strozewski, Skye Wolfer

Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006