Dean G. Jarrett

According to our database, Dean G. Jarrett authored at least 18 papers between 1999 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

Implementation of a 1 GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration.

Marta Musso, Wei-Chen Lin, Yanfei Yang, Ngoc Thanh Mai Tran, Alireza R. Panna, Cheng-Hsueh Yang, Randolph E. Elmquist, David B. Newell, Chi-Te Liang, Massimo Ortolano, Albert F. Rigosi, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2025

2023

Graphene-Based Star-Mesh Resistance Networks.

Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi

IEEE Trans. Instrum. Meas., 2023

2022

Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge.

Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang

IEEE Trans. Instrum. Meas., 2022

2020

Comparison of Multiple Methods for Obtaining P $\Omega$ Resistances With Low Uncertainties.

Kwang Min Yu, Dean G. Jarrett, Albert F. Rigosi, Shamith U. Payagala, Marlin Kraft

IEEE Trans. Instrum. Meas., 2020

Using a Natural Ratio to Compare DC and AC Resistances.

Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee

IEEE Trans. Instrum. Meas., 2020

Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe.

Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell

IEEE Trans. Instrum. Meas., 2020

Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices.

Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2020

2019

Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.

Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist

IEEE Trans. Instrum. Meas., 2019

The units for mass, voltage, resistance, and electrical current in the SI.

Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist

IEEE Instrum. Meas. Mag., 2019

2013

Report to TIM Editor on CPEM 2012.

Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2013

2009

SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.

Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina

IEEE Trans. Instrum. Meas., 2009

2005

Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator.

Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman

IEEE Trans. Instrum. Meas., 2005

2003

Statistical uncertainty analysis of key comparison CCEM-K2.

Nien Fan Zhang, Nell Sedransk, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2003

CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards.

Dean G. Jarrett, Ronald F. Dziuba

IEEE Trans. Instrum. Meas., 2003

2001

Analysis of a dual-balance high-resistance bridge at 10 TΩ.

Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2001

Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory.

Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett

IEEE Trans. Instrum. Meas., 2001

1999

Evaluation of guarded high-resistance Hamon transfer standards.

Dean G. Jarrett

IEEE Trans. Instrum. Meas., 1999

Fabrication of high-value standard resistors.

Ronald F. Dziuba, Dean G. Jarrett, Lisa L. Scott, Andrew J. Secula

IEEE Trans. Instrum. Meas., 1999