Dennis Willie

According to our database, Dennis Willie authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of six.

2009

Drop impact reliability of edge-bonded lead-free chip scale packages.

Andrew Farris, Jianbiao Pan, Albert A. Liddicoat, Michael Krist, Nicholas A. Vickers, Brian J. Toleno, Dan Maslyk, Dongkai Shangguan, Jasbir Bath, Dennis Willie, David A. Geiger

Microelectron. Reliab., 2009