Dongbhin Kim

According to our database, Dongbhin Kim authored at least 1 paper in 2025.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2025

Hydrogen and oxygen induced abnormal reliability degradation in flexible top-gate amorphous In-Ga-Zn-O thin-film transistors under negative bias thermal illumination stress.

Dongbhin Kim, Kyeong-Bae Lee, Byoungdeog Choi

Microelectron. J., 2025