Byoungdeog Choi

According to our database, Byoungdeog Choi authored at least 3 papers between 2012 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Novel Method for Nondestructive Body Effect Measurement in Dynamic Random Access Memory.

Il-Woo Jung, Bonggu Sung, Byoungdeog Choi

J. Electron. Test., 2017

2012

The effect of gate overlap lightly doped drains on low temperature poly-Si thin film transistors.

Jaehyun Cho, Sungwook Jung, Kyungsoo Jang, Hyungsik Park, Jongkyu Heo, Wonbaek Lee, DaeYoung Gong, Seungman Park, Hyungwook Choi, Hanwook Jung, Byoungdeog Choi, Junsin Yi

Microelectron. Reliab., 2012

Current-voltage characteristics of vertical diodes for next generation memories.

Hokyun An, Kong-Soo Lee, Yoongoo Kang, Seonghoon Jeong, Wonseok Yoo, Jae-Jong Han, Bonghyun Kim, Hanjin Lim, Seokwoo Nam, Gi-Tae Jeong, Ho-Kyu Kang, Chilhee Chung, Byoungdeog Choi

Proceedings of the 2012 European Solid-State Device Research Conference, 2012