Dung Dau

According to our database1, Dung Dau authored at least 2 papers in 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2025
Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

The Impact of Silicon Concentration on the Reliability of Tungsten Silicide.
Proceedings of the IEEE International Reliability Physics Symposium, 2025


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