E. Guziewicz
Orcid: 0000-0001-6158-5258
According to our database1,
E. Guziewicz authored at least 2 papers
between 2009 and 2025.
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Bibliography
2025
Impact of Trapped Charge on the Breakdown Phenomena in HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> - Based Memory Capacitors.
J. Circuits Syst. Comput., 2025
2009
The influence of growth temperature and precursors' doses on electrical parameters of ZnO thin films grown by atomic layer deposition technique.
Microelectron. J., 2009