E. Guziewicz

Orcid: 0000-0001-6158-5258

According to our database1, E. Guziewicz authored at least 2 papers between 2009 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2025
Impact of Trapped Charge on the Breakdown Phenomena in HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> - Based Memory Capacitors.
J. Circuits Syst. Comput., 2025

2009
The influence of growth temperature and precursors' doses on electrical parameters of ZnO thin films grown by atomic layer deposition technique.
Microelectron. J., 2009


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