Eugene R. Hnatek

According to our database1, Eugene R. Hnatek authored at least 13 papers between 1976 and 1997.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

1997
Diagnosing IC Failures in a Fast Environment.
IEEE Des. Test Comput., 1997

1995
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1993
Application of Statistical Techniques to Critical System Parameters.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1989
Quality Issues of High Pin Count Fine Pitch VLSI Packages.
Proceedings of the Proceedings International Test Conference 1989, 1989

1986
IC Burn-In : The Changing Scene.
Proceedings of the Proceedings International Test Conference 1986, 1986

1984
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook).
Proceedings of the Proceedings International Test Conference 1984, 1984

Thoughts on VLSI Burn-in.
Proceedings of the Proceedings International Test Conference 1984, 1984

1982
An Evaluation of the 2816 EEPROM.
Proceedings of the Proceedings International Test Conference 1982, 1982

1981
Documentation for Testability : The Supplier's Responsibility to the User.
Proceedings of the Proceedings International Test Conference 1981, 1981

1977
Physics of computer memory devices: S Middelhoek, P K George and P Dekker. Academic Press (1976), 402 pp, £12.50.
Microprocess., 1977

Microprocessor device reliability.
Microprocess., 1977

Microprocessor-digital converter applications.
Microprocess., 1977

1976
Semiconductor memories: A review.
Microprocess., 1976


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