Euisang Oh
Orcid: 0009-0004-1330-0528
According to our database1,
Euisang Oh authored at least 3 papers
between 2010 and 2025.
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Bibliography
2025
DRAM Fault Classification through Large-Scale Field Monitoring for Robust Memory RAS Management.
Proceedings of the 58th IEEE/ACM International Symposium on Microarchitecture, 2025
2010
Proceedings of the ACM SIGGRAPH ASIA 2010 Posters, Seoul, Republic of Korea, December 15, 2010
Proceedings of the ACM SIGGRAPH ASIA 2010 Posters, Seoul, Republic of Korea, December 15, 2010