Fengjun Duan

Orcid: 0000-0002-5481-2739

According to our database1, Fengjun Duan authored at least 12 papers between 2016 and 2023.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

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Bibliography

2023
Remaining useful life evaluation for accelerated Wiener degradation process model with mixed random effects and measurement errors.
Qual. Reliab. Eng. Int., June, 2023

2022
Bayesian analysis for the transformed exponential dispersion process with random effects.
Reliab. Eng. Syst. Saf., 2022

Generalized exponential-dispersion process model for degradation analysis under nonlinear condition.
Qual. Reliab. Eng. Int., 2022

Two shock models for single-component systems subject to mutually dependent failure processes.
Qual. Reliab. Eng. Int., 2022

2021
Reliability analysis for <i>k</i>-out-of-(n+1): G star configuration multi-state systems with performance sharing.
Comput. Ind. Eng., 2021

2020
Reliability evaluation of a <i>k</i>-out-of-<i>n</i>(G)-subsystem based multi-state system with common bus performance sharing.
Reliab. Eng. Syst. Saf., 2020

2018
Exponential-Dispersion Degradation Process Models With Random Effects and Covariates.
IEEE Trans. Reliab., 2018

Reliability evaluation of multi-state series systems with performance sharing.
Reliab. Eng. Syst. Saf., 2018

Inverse Gaussian process models for bivariate degradation analysis: A Bayesian perspective.
Commun. Stat. Simul. Comput., 2018

Planning of step-stress accelerated degradation test based on non-stationary gamma process with random effects.
Comput. Ind. Eng., 2018

2017
Reliability Modeling of Two-Phase Gamma Degradation Process.
Proceedings of the 2017 IEEE International Conference on Software Quality, 2017

2016
Planning of step-stress accelerated degradation test based on the inverse Gaussian process.
Reliab. Eng. Syst. Saf., 2016


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