Francisco de Assis Boldt

According to our database1, Francisco de Assis Boldt authored at least 10 papers between 2013 and 2017.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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In proceedings 
Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2017
Cascade Feature Selection and ELM for automatic fault diagnosis of the Tennessee Eastman process.
Neurocomputing, 2017

Binary feature selection classifier ensemble for fault diagnosis of submersible motor pump.
Proceedings of the 26th IEEE International Symposium on Industrial Electronics, 2017

Kernel and random extreme learning machine applied to submersible motor pump fault diagnosis.
Proceedings of the 2017 International Joint Conference on Neural Networks, 2017

2015
Heterogeneous Feature Models and Feature Selection Applied to Bearing Fault Diagnosis.
IEEE Trans. Industrial Electronics, 2015

Fast feature selection using hybrid ranking and wrapper approach for automatic fault diagnosis of motorpumps based on vibration signals.
Proceedings of the 13th IEEE International Conference on Industrial Informatics, 2015

Single Sequence Fast Feature Selection for High-Dimensional Data.
Proceedings of the 27th IEEE International Conference on Tools with Artificial Intelligence, 2015

2014
Performance analysis of extreme learning machine for automatic diagnosis of electrical submersible pump conditions.
Proceedings of the 12th IEEE International Conference on Industrial Informatics, 2014

Evaluation of the Extreme Learning Machine for automatic fault diagnosis of the Tennessee Eastman chemical process.
Proceedings of the IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, Dallas, TX, USA, October 29, 2014

2013
Computational intelligence for automatic diagnosis of submersible motor pump conditions in offshore oil exploration.
Proceedings of the 20th IEEE International Conference on Electronics, 2013

Feature models and condition visualization for rotating machinery fault diagnosis.
Proceedings of the 20th IEEE International Conference on Electronics, 2013


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