Gangshi Hu
  According to our database1,
  Gangshi Hu
  authored at least 12 papers
  between 2007 and 2017.
  
  
Collaborative distances:
Collaborative distances:
Timeline
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On csauthors.net:
Bibliography
  2017
    Comput. Chem. Eng., 2017
    
  
Development of a high fidelity and subspace identification model of a hydrogen plant startup dynamics.
    
  
    Proceedings of the 2017 American Control Conference, 2017
    
  
  2013
A non-Gaussian pattern matching based dynamic process monitoring approach and its application to cryogenic air separation process.
    
  
    Comput. Chem. Eng., 2013
    
  
An independent component analysis and mutual information based non-Gaussian pattern matching method for fault detection and diagnosis of complex cryogenic air separation process.
    
  
    Proceedings of the American Control Conference, 2013
    
  
  2011
Dependence of film surface roughness on surface migration and lattice size in thin film deposition.
    
  
    Proceedings of the American Control Conference, 2011
    
  
  2010
Simultaneous regulation of thin film surface mean slope and roughness for light trapping optimization using predictive control.
    
  
    Proceedings of the 49th IEEE Conference on Decision and Control, 2010
    
  
  2009
Simultaneous regulation of film thickness, surface roughness and porosity in a multiscale thin film growth process.
    
  
    Proceedings of the 48th IEEE Conference on Decision and Control, 2009
    
  
Model predictive control of nonlinear stochastic PDEs: Application to a sputtering process.
    
  
    Proceedings of the American Control Conference, 2009
    
  
    Proceedings of the American Control Conference, 2009
    
  
    Proceedings of the American Control Conference, 2009
    
  
  2008
Dynamic output feedback covariance control of linear stochastic dissipative partial differential equations.
    
  
    Proceedings of the American Control Conference, 2008
    
  
  2007
Control configuration selection and distributed nonlinear control of surface roughness in a sputtering process.
    
  
    Proceedings of the 46th IEEE Conference on Decision and Control, 2007