Gangshi Hu

According to our database1, Gangshi Hu authored at least 12 papers between 2007 and 2017.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2017
Subspace-based model identification of a hydrogen plant startup dynamics.
Comput. Chem. Eng., 2017

Development of a high fidelity and subspace identification model of a hydrogen plant startup dynamics.
Proceedings of the 2017 American Control Conference, 2017

2013
A non-Gaussian pattern matching based dynamic process monitoring approach and its application to cryogenic air separation process.
Comput. Chem. Eng., 2013

An independent component analysis and mutual information based non-Gaussian pattern matching method for fault detection and diagnosis of complex cryogenic air separation process.
Proceedings of the American Control Conference, 2013

2011
Dependence of film surface roughness on surface migration and lattice size in thin film deposition.
Proceedings of the American Control Conference, 2011

2010
Simultaneous regulation of thin film surface mean slope and roughness for light trapping optimization using predictive control.
Proceedings of the 49th IEEE Conference on Decision and Control, 2010

2009
Simultaneous regulation of film thickness, surface roughness and porosity in a multiscale thin film growth process.
Proceedings of the 48th IEEE Conference on Decision and Control, 2009

Model predictive control of nonlinear stochastic PDEs: Application to a sputtering process.
Proceedings of the American Control Conference, 2009

Model predictive control of film porosity in thin film deposition.
Proceedings of the American Control Conference, 2009

Stochastic modeling of film porosity in thin film deposition.
Proceedings of the American Control Conference, 2009

2008
Dynamic output feedback covariance control of linear stochastic dissipative partial differential equations.
Proceedings of the American Control Conference, 2008

2007
Control configuration selection and distributed nonlinear control of surface roughness in a sputtering process.
Proceedings of the 46th IEEE Conference on Decision and Control, 2007


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