Gordon D. Robinson

According to our database, Gordon D. Robinson authored at least 10 papers between 1983 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2005

Board and system test with SoC DFT.

Gordon D. Robinson

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Open Architecture ATE: Dream or Reality?

Gordon D. Robinson

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

Board Test: Wanted Dead or Alive.

Gordon D. Robinson

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1999

DFT, test lifecycles and the product lifecycle.

Gordon D. Robinson

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1994

NAND Trees Accurately Diagnose Board-Level Pin Faults.

Gordon D. Robinson

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1992

Design and Test - The Next Problems.

Gordon D. Robinson

Proceedings of the Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computer & Processors, 1992

1991

Scan test architectures for digital board testers.

Matthew L. Fichtenbaum, Gordon D. Robinson

J. Electron. Test., 1991

1990

Interconnect testing of boards with partial boundary scan.

Gordon D. Robinson, John G. Deshayes

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1984

Artificial Intelligence and Testing.

Gordon D. Robinson

Proceedings of the Proceedings International Test Conference 1984, 1984

1983

HITEST : Intelligent Test Generation.

Gordon D. Robinson

Proceedings of the Proceedings International Test Conference 1983, 1983