Hein-Mun Lam

According to our database1, Hein-Mun Lam authored at least 1 paper in 2013.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Links

On csauthors.net:

Bibliography

2013
Design for manufacturing layout analyses correlate layout to physico-chemical yield loss mechanisms.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013


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