Heui-Jae Pahk

According to our database¹, Heui-Jae Pahk authored at least 3 papers between 2012 and 2024.

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2024

Enhancing Battery Exterior Defect Inspection Accuracy Through Defect-Background Separated GAN Development.

[BibT_eX]

[DOI]

IEEE Access, 2024

2014

Real-time critical dimension measurement of thin film transistor liquid crystal display patterns using optical coherence tomography.

[BibT_eX]

[DOI]

J. Electronic Imaging, 2014

2012

Novel, fast, edge-directed image reconstruction algorithm using a substepping system for critical-dimension measurement of glass panels.

[BibT_eX]

[DOI]

J. Electronic Imaging, 2012