Houng-Chi Wei

According to our database1, Houng-Chi Wei authored at least 2 papers in 2006.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

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Article 
PhD thesis 
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Links

On csauthors.net:

Bibliography

2006
Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory.
Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006

Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory.
Proceedings of the 14th IEEE International Workshop on Memory Technology, 2006


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