Hyeong Joon Kim

According to our database1, Hyeong Joon Kim authored at least 1 paper in 2003.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of six.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2003
Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide.
Microelectron. Reliab., 2003


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