Isik C. Kizilyalli
According to our database1, Isik C. Kizilyalli authored at least 3 papers between 1999 and 2015.
IEEE Fellow 2007, "For contributions to integrated circuit technology".
Legend:Book In proceedings Article PhD thesis Other
Reliability studies of vertical GaN devices based on bulk GaN substrates.
Microelectron. Reliab., 2015
Invited Paper: Extending Resolution Limits of IC Fabrication Technology: Demonstration by Device Fabrication and Circuit Performance.
Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001
Channel Hot Electron Degradation-Delay in MOS Transistors Due to Deuterium Anneal.
Proceedings of the VLSI Handbook., 1999